As devices become smaller and smarter, packaged semiconductor manufacturers are competing on their ability to deliver innovative form factors and materials. Sonix continuously advances our acoustic microscopy and analysis tools to clearly identify defects in the newest, most complex flip chip packages.
Sonix systems provide the image quality and throughput manufacturers of flip chip technology need to eliminate flip chip bonding defects at the process level and maximize inspection rates on the production line. Sonix provides automated tray scanning of individual flip chip packages and board-mounted flip chip technologies, with tools to optimize analysis of features such as:
Learn advanced inspection techniques for Cu Pillars, molded underfill and stacked die package. Download our new white paper.
|This advanced scanning acoustic microscope features the Sonix Image Enhancement Suite for industry-leading image quality.||Sonix ECHO provides a universal inspection tool for 3D package development, production and failure analysis.|
|Our next-generation solution for high-volume production environments adds fully automated JEDEC tray handling to maximize productivity.|
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