Faster, more accurate defect detection requires more than superior equipment. Sonix provides the expertise needed to solve customer challenges. This is your source for non-destructive testing pdf resources, including technical papers, product literature and other information to help you optimize defect detection and productivity.
Here you’ll find in-depth discussion of wafer and packaged semiconductor applications, acoustic scanning and analysis techniques, best practices and other technical topics for non-destructive testing – pdf format.
Learn more about Sonix scanning acoustic microscopes, Sonix transducers, hardware and software options. Sonix systems can be configured to provide the best possible results in a wide variety of applications.
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