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Visualize the smallest subsurface features and defects in bonded wafers, packaged semiconductors and industrial materials. Scanning acoustic microscopy provides the nondestructive insight you need to make your products better.

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DETECT

DETECT

measure, and analyze
sub-surface defects

COLLECT

COLLECT

data at multiple sample
depths in a single scan

SCAN

SCAN

discrete devices, trays,
strips, or wafers

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